News & Event

Our newsletter Vol. 0039 - An ALL-elements AES depth profile is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0038 - Tutorial of AES depth profiling is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0037 - Tutorial of qualification & quantification in AES is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

On September 1st, the Kunming University of Science and Technology celebrated its 60th anniversary day. On that day, hundreds of guests from home and abroad, representatives of the alumni gathered together, held a ceremony to celebrate the anniversary.   Upon invitation by the Analysis & Test Center of KUST, Mr.Ye Shangyuan and Ms.Lu Defeng of CoreTech Int. joined the anniversary activities and gave a technical lecture at KUST Conference Hall on 2014-9-2 morning. The principles, functions, applications and data collecting & processing of PHI XPS & AES were introduced in the lecture, technical exchanges with the teachers and students were carried out after the lecture. Nearly one hundred people attended the conference.   The technical discussions of XPS and SIMS application in lithium-ion batteries and fuel cells was held in the Library meeting room that afternoon, with the related research team of teachers and students. Meanwhile, PHI MULTIPAK software was introduced in details.   The technical conference got great support and positive feedback from KUST teachers and students, who know more about the applications of surface analysis techniques--PHI XPS & AES in various industries and fields.        

Our newsletter Vol. 0036 - Data reduction of XPS depth profiling by using LLS and TFA is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

China Surface Analysis and Application Conference 2014 has been successfully held at Hongwa Hotel in Sichuan University, Chengdu on August 29 & 30.     CoreTech Integrated (Beijing) Limited have attended the conference and invited Mr Shibasaki and Mr Sanada, specialists from ULVAC-PHI, Inc. to join this event.  We have set up a booth at the meeting venue and displayed information of surface analysis instruments manufactured by ULVAC-PHI, Inc including XPS (X-ray Photo-Electron Spectroscopy), AES (Auger Electron Spectroscopy) and Tof-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry).     Mr Sanada had presented a talk titled as “Scanning XPS Microprobe to Support Advanced Inorganic and Organic Materials Analysis” in this conference. In this topic, Mr. Sanada had explained the principle of scanning X-ray photoelectron spectroscopy and its advantage. Meanwhile, he had also introduced the applications of IC assembly packaging micro-size jointing and fuel cells using the XPS tool for analysis, which provided all participants a deeper understanding on the advantages of Scanning XPS Microprobe.  

Our newsletter Vol. 0035 -  An ALL-elements XPS depth profile  is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0034 - Tutorial of XPS depth profiling is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0033 - Tutorial of qualification & quantification in XPS is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

Our newsletter Vol. 0032 - CoreTech launches a new website under instrument.cn is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!